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The Journal of Neuroscience, March 19, 2008, ():
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Serial Section Scanning Electron Microscopy of Adult Brain Tissue Using Focused Ion Beam Milling
J. Neurosci. Knott et al. 28: 2959Supplemental Data
Files in this Data Supplement:
- supplemental material - Supplemental Legend
- supplemental material - Supplemental Figure
- supplemental material - Supplemental Movie
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