Automatic epileptic seizure detection in EEGs based on line length feature and artificial neural networks

J Neurosci Methods. 2010 Aug 15;191(1):101-9. doi: 10.1016/j.jneumeth.2010.05.020. Epub 2010 Jun 2.

Abstract

About 1% of the people in the world suffer from epilepsy. The main characteristic of epilepsy is the recurrent seizures. Careful analysis of the electroencephalogram (EEG) recordings can provide valuable information for understanding the mechanisms behind epileptic disorders. Since epileptic seizures occur irregularly and unpredictably, automatic seizure detection in EEG recordings is highly required. Wavelet transform (WT) is an effective analysis tool for non-stationary signals, such as EEGs. The line length feature reflects the waveform dimensionality changes and is a measure sensitive to variation of the signal amplitude and frequency. This paper presents a novel method for automatic epileptic seizure detection, which uses line length features based on wavelet transform multiresolution decomposition and combines with an artificial neural network (ANN) to classify the EEG signals regarding the existence of seizure or not. To the knowledge of the authors, there exists no similar work in the literature. A famous public dataset was used to evaluate the proposed method. The high accuracy obtained for three different classification problems testified the great success of the method.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Algorithms
  • Artificial Intelligence*
  • Databases as Topic / classification
  • Databases as Topic / standards
  • Electroencephalography / classification
  • Electroencephalography / methods*
  • Epilepsy / classification
  • Epilepsy / diagnosis*
  • Epilepsy / physiopathology*
  • Evoked Potentials / physiology
  • Fourier Analysis
  • Humans
  • Neural Networks, Computer*
  • Pattern Recognition, Automated / classification
  • Pattern Recognition, Automated / methods*
  • Predictive Value of Tests
  • Signal Processing, Computer-Assisted*
  • Software / classification
  • Software / standards
  • Time Factors